SIMULATING THE DAMAGE CAUSED BY CERTAIN INSECTS FOR WHEAT PANICLES IN RELATION TO YIELD LOSSES

Document Type : Original Article

Authors

1 Plant Protection Research Institute, Agricultural Research Center, Dokki, Giza, Egypt

2 Moshtehor Agricultural Faculty, Zagazig University, Egypt

Abstract

An experiment was carried out to clarify the effect of an artificial insect damage, at different rates, for wheat panicles on the yield. The experiment was established at Sharkia governorate, using Sakha 93variety, during 2002/2003 season. Six levels of damage, 2, 10, 20, 30, 40, and 50% cut panicles were done on 27/3/2003, beginning of the flower stage. Mean weight of the grain yield was significantly affected with the damage and showed a regression coefficient of 0.94%. Also, mean weight of the panicles was affected and had a regression coefficient of 1.01%. On the other hand, mean weight of 100 grains was not significantly affected and had a regression coefficient of 0.086% only.